Florian Peter Pribahsnik, Michael Nelhiebel, M. Mataln, Mirko Bernardoni, G. Prechtl, F. Altmann, D. Poppitz, A. Lindemann. Exploring the thermal limit of GaN power devices under extreme overload conditions. Microelectronics Reliability, 76:304-308, 2017. [doi]
Abstract is missing.