Fast Functional Test Generation Using an SDL Model

Robert L. Probert, Alan W. Williams. Fast Functional Test Generation Using an SDL Model. In Gyula Csopaki, Sarolta Dibuz, Katalin Tarnay, editors, Testing of Communicating Systems: Method and Applications, IFIP TC6 12:::th::: International Workshop on Testing Communicating Systems, September 1-3, 1999, Budapest, Hungary. Volume 147 of IFIP Conference Proceedings, pages 299-316, Kluwer, 1999.

@inproceedings{ProbertW99,
  title = {Fast Functional Test Generation Using an SDL Model},
  author = {Robert L. Probert and Alan W. Williams},
  year = {1999},
  tags = {testing},
  researchr = {https://researchr.org/publication/ProbertW99},
  cites = {0},
  citedby = {0},
  pages = {299-316},
  booktitle = {Testing of Communicating Systems: Method and Applications, IFIP TC6 12:::th::: International Workshop on Testing Communicating Systems, September 1-3, 1999, Budapest, Hungary},
  editor = {Gyula Csopaki and Sarolta Dibuz and Katalin Tarnay},
  volume = {147},
  series = {IFIP Conference Proceedings},
  publisher = {Kluwer},
  isbn = {0-7923-8581-0},
}