Abstract is missing.
- Different Approaches to Protocol and Service TestingAna R. Cavalli. 3-18
- Towards the Third Edition of TTCNJens Grabowski, Dieter Hogrefe. 19-30
- New Directions in ASN.1: Towards a Formal Notation for Transfer SyntaxColin Willcock. 31-42
- Testability with Unbounded Testing StrategiesBernd Baumgarten, Olaf Henniger. 43-60
- Configuration and Execution Support for Distributed TestsTheofanis Vassiliou-Gioles, Ina Schieferdecker, Marc Born, Mario Winkler, Mang Li. 61-76
- Principles and Tools for Testing Open Distributed SystemsMohammed Benattou, Leo Cacciari, Régis Pasini, Omar Rafiq. 77-92
- Architectures for Testing Distributed SystemsAndreas Ulrich, Hartmut König. 93-108
- Decision on Tester Configuration for Multiparty TestingMaria Törö. 109-130
- Protocol-Inspired Hardware TestingJi He, Kenneth J. Turner. 131-148
- Automated Test of TCP Congestion Control AlgorithmsRoland Gecse, Péter Krémer. 149-166
- Test Templates for Test GenerationMarco Hollenberg. 167-178
- Formal Test Automation: A Simple ExperimentAxel Belinfante, Jan Feenstra, René G. de Vries, Jan Tretmans, Nicolae Goga, Loe M. G. Feijs, Sjouke Mauw, Lex Heerink. 179-196
- Generating Test Cases for a Timed I/O Automaton ModelTeruo Higashino, Akio Nakata, Kenichi Taniguchi, Ana R. Cavalli. 197-214
- Test Generation Driven by User-defined Fault ModelsI. Koufareva, Alexandre Petrenko, Nina Yevtushenko. 215-236
- Test Suite Minimization for Embedded Nondeterministic Finite State MachinesNina Yevtushenko, Ana R. Cavalli, Ricardo Anido. 237-250
- Automated Test Case Selection Based on SubpurposesTibor Csöndes, Balázs Kotnyek. 251-266
- Conformance Testing of Multiprotocol IUTsYongbum Park, Myungchul Kim, Sungwon Kang. 267-286
- The Challenge of QoS VerificationJan de Meer, Son T. Vuong. 287-298
- Fast Functional Test Generation Using an SDL ModelRobert L. Probert, Alan W. Williams. 299-316
- Performance Testing at Early Design PhasesPeter Csurgay, Mazen Malek. 317-330
- Development and Application of ATM Protocol Conformance Test SystemSungwon Kang, Youngsoo Seo, Deukyoon Kang, Mijeong Hong, Junhwan Yang, Ilkook Koh, Jaehwi Shin, Sangjo Yoo, Myungchul Kim. 331-346
- Automatic Test Case Generation from the Industrial Point of View: Conformance Testing in IskraTELMarjeta Frey-Pucko, Monika Kapus-Kolar, Roman Novak. 347-362
- External Conformance Requirements: Concepts, Methods and ToolsRafal Artych, Krzysztof M. Brzezinski. 363-378
- Time Simulation Methods for Testing Protocol Software Embedded in Communicating SystemsJuhani Latvakoski, H. Honka. 379-394