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Test Generation for Hybrid Systems Using Clustering and Learning Techniques

Sudhi Proch, Prabhat Mishra. Test Generation for Hybrid Systems Using Clustering and Learning Techniques. In 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016. pages 589-590, IEEE Computer Society, 2016. [doi]

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