Steffen Prohaska, Andrei Hutanu, Ralf Kähler, Hans-Christian Hege. Interactive Exploration of Large Remote Micro-CT Scans. In 15th IEEE Visualization 2004 Conference (VIS 2004), 10-15 October 2004, Austin, TX, USA. pages 345-352, IEEE Computer Society, 2004. [doi]
Abstract is missing.