Benoit Provost, Edgar Sánchez-Sinencio. On-chip ramp generators for mixed-signal BIST and ADC self-test. J. Solid-State Circuits, 38(2):263-273, 2003. [doi]
@article{ProvostS03,
title = {On-chip ramp generators for mixed-signal BIST and ADC self-test},
author = {Benoit Provost and Edgar Sánchez-Sinencio},
year = {2003},
doi = {10.1109/JSSC.2002.807415},
url = {https://doi.org/10.1109/JSSC.2002.807415},
researchr = {https://researchr.org/publication/ProvostS03},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {38},
number = {2},
pages = {263-273},
}