Highly scalable methods for exploiting a label with unknown location in order to orient a set of single-particle cryo electron microscopy images - researchr publication authors

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Cory J. Prust, Qiu Wang, Peter C. Doerschuk, John E. Johnson. Highly scalable methods for exploiting a label with unknown location in order to orient a set of single-particle cryo electron microscopy images. In Charles A. Bouman, Ilya Pollak, Patrick J. Wolfe, editors, Computational Imaging X, part of the IS&T-SPIE Electronic Imaging Symposium, Burlingame, California, USA, January 22, 2012, Proceedings. Volume 8296 of SPIE Proceedings, IS&T/SPIE, 2012. [doi]

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