Highly scalable methods for exploiting a label with unknown location in order to orient a set of single-particle cryo electron microscopy images

Cory J. Prust, Qiu Wang, Peter C. Doerschuk, John E. Johnson. Highly scalable methods for exploiting a label with unknown location in order to orient a set of single-particle cryo electron microscopy images. In Charles A. Bouman, Ilya Pollak, Patrick J. Wolfe, editors, Computational Imaging X, part of the IS&T-SPIE Electronic Imaging Symposium, Burlingame, California, USA, January 22, 2012, Proceedings. Volume 8296 of SPIE Proceedings, IS&T/SPIE, 2012. [doi]

@inproceedings{PrustWDJ12,
  title = {Highly scalable methods for exploiting a label with unknown location in order to orient a set of single-particle cryo electron microscopy images},
  author = {Cory J. Prust and Qiu Wang and Peter C. Doerschuk and John E. Johnson},
  year = {2012},
  doi = {10.1117/12.917838},
  url = {http://dx.doi.org/10.1117/12.917838},
  researchr = {https://researchr.org/publication/PrustWDJ12},
  cites = {0},
  citedby = {0},
  booktitle = {Computational Imaging X, part of the IS&T-SPIE Electronic Imaging Symposium, Burlingame, California, USA, January 22, 2012, Proceedings},
  editor = {Charles A. Bouman and Ilya Pollak and Patrick J. Wolfe},
  volume = {8296},
  series = {SPIE Proceedings},
  publisher = {IS&T/SPIE},
}