Reid Pryzant, Stefano Ermon, David Lobell. Monitoring Ethiopian Wheat Fungus with Satellite Imagery and Deep Feature Learning. In 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops, Honolulu, HI, USA, July 21-26, 2017. pages 1524-1532, IEEE Computer Society, 2017. [doi]
Abstract is missing.