Built-in sequential fault self-testing of array multipliers

Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis. Built-in sequential fault self-testing of array multipliers. IEEE Trans. on CAD of Integrated Circuits and Systems, 24(3):449-460, 2005. [doi]

@article{PsarakisGP05,
  title = {Built-in sequential fault self-testing of array multipliers},
  author = {Mihalis Psarakis and Dimitris Gizopoulos and Antonis M. Paschalis},
  year = {2005},
  doi = {10.1109/TCAD.2004.842806},
  url = {http://dx.doi.org/10.1109/TCAD.2004.842806},
  tags = {testing},
  researchr = {https://researchr.org/publication/PsarakisGP05},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {24},
  number = {3},
  pages = {449-460},
}