Mihalis Psarakis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian. An Effective BIST Architecture for Sequential Fault Testing in Array Multipliers. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 252-259, IEEE Computer Society, 1999. [doi]
Abstract is missing.