Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies

H. Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti. Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. Microelectronics Reliability, 41(9-10):1319-1324, 2001.

Abstract

Abstract is missing.