Laura L. Pullum, Dave Towey, Upulee Kanewala, Chang-ai Sun, Márcio Eduardo Delamaro. MET 2017 Workshop Summary. In 2nd IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2017, Buenos Aires, Argentina, May 22, 2017. pages 1, IEEE Computer Society, 2017. [doi]
@inproceedings{PullumTKSD17,
title = {MET 2017 Workshop Summary},
author = {Laura L. Pullum and Dave Towey and Upulee Kanewala and Chang-ai Sun and Márcio Eduardo Delamaro},
year = {2017},
doi = {10.1109/MET.2017.11},
url = {http://doi.ieeecomputersociety.org/10.1109/MET.2017.11},
researchr = {https://researchr.org/publication/PullumTKSD17},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {2nd IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2017, Buenos Aires, Argentina, May 22, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-0424-3},
}