Enhanced Timing-Based Transition Delay Testing for Small Delay Defects

Richard Putman, Rahul Gawde. Enhanced Timing-Based Transition Delay Testing for Small Delay Defects. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 336-342, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.