Haochen Qi, Huiyan Ji, Jiqiang Zhang, Liu Cheng, Xiangwei Kong. Defect Classification Method of X-ray Images Based on Improved U-Net. In Proceedings of the 4th International Conference on Advanced Information Science and System, AISS 2022, Sanya, China, November 25-27, 2022. ACM, 2022. [doi]
@inproceedings{QiJZCK22,
title = {Defect Classification Method of X-ray Images Based on Improved U-Net},
author = {Haochen Qi and Huiyan Ji and Jiqiang Zhang and Liu Cheng and Xiangwei Kong},
year = {2022},
doi = {10.1145/3573834.3574509},
url = {https://doi.org/10.1145/3573834.3574509},
researchr = {https://researchr.org/publication/QiJZCK22},
cites = {0},
citedby = {0},
booktitle = {Proceedings of the 4th International Conference on Advanced Information Science and System, AISS 2022, Sanya, China, November 25-27, 2022},
publisher = {ACM},
isbn = {978-1-4503-9793-3},
}