Haochen Qi, Huiyan Ji, Jiqiang Zhang, Liu Cheng, Xiangwei Kong. Defect Classification Method of X-ray Images Based on Improved U-Net. In Proceedings of the 4th International Conference on Advanced Information Science and System, AISS 2022, Sanya, China, November 25-27, 2022. ACM, 2022. [doi]
Abstract is missing.