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Data-driven fault diagnosis and prognosis for process faults using principal component analysis and extreme learning machine

Ruosen Qi, Jie Zhang. Data-driven fault diagnosis and prognosis for process faults using principal component analysis and extreme learning machine. In 18th IEEE International Conference on Industrial Informatics, INDIN 2020, Warwick, United Kingdom, July 20-23, 2020. pages 775-780, IEEE, 2020. [doi]

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