Localization and physical analysis of a complex SRAM failure in 90nm technology

Zhongling Qian, Frank Siegelin, Birgit Tippelt, Stefan Müller. Localization and physical analysis of a complex SRAM failure in 90nm technology. Microelectronics Reliability, 46(9-11):1558-1562, 2006. [doi]

Abstract

Abstract is missing.