Qi Qiao, Azlin Ahmad, Huiying Hu, Ke Wang 0019. Advancements in Industrial Product Surface Defect Detection: From Traditional Methods to Modern Advanced Techniques. In Kim Jon-Lark, editor, Machine Learning and Intelligent Systems - Proceedings of MLIS 2024, Kampar, Perak, Malaysia, 17-20 November 2024. Volume 393 of Frontiers in Artificial Intelligence and Applications, pages 82-89, IOS Press, 2024. [doi]
Abstract is missing.