Total ionizing radiation effects of 2-T SONOS for 130 nm/4 Mb NOR flash memory technology

Fengying Qiao, Liyang Pan, Xiao Yu, Haozhi Ma, Dong Wu, Jun Xu. Total ionizing radiation effects of 2-T SONOS for 130 nm/4 Mb NOR flash memory technology. Science in China Series F: Information Sciences, 57(6):1-9, 2014. [doi]

Abstract

Abstract is missing.