Dongdong Qiao, Xuezhe Wei, Bo Jiang, Wenjun Fan, Hui Gong, Xin Lai 0004, Yuejiu Zheng, Haifeng Dai. Data-Driven Fault Diagnosis of Internal Short Circuit for Series-Connected Battery Packs Using Partial Voltage Curves. IEEE Trans. Industrial Informatics, 20(4):6751-6761, April 2024. [doi]
Abstract is missing.