The test process date based quality defect detection strategy for spacecraft components - researchr publication authors

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Taichun Qin, Shouwen Liu, Shouqing Huang, Yuege Zhou. The test process date based quality defect detection strategy for spacecraft components. In 7th International Conference on Dependable Systems and Their Applications, DSA 2020, Xi'an, China, November 28-29, 2020. pages 550-554, IEEE, 2020. [doi]

This author has not been identified. Look up 'Taichun Qin' in GoogleThis author has not been identified. Look up 'Shouwen Liu' in GoogleThis author has not been identified. Look up 'Shouqing Huang' in GoogleThis author has not been identified. Look up 'Yuege Zhou' in Google

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