Taichun Qin, Shouwen Liu, Shouqing Huang, Yuege Zhou. The test process date based quality defect detection strategy for spacecraft components. In 7th International Conference on Dependable Systems and Their Applications, DSA 2020, Xi'an, China, November 28-29, 2020. pages 550-554, IEEE, 2020. [doi]
@inproceedings{QinLHZ20,
title = {The test process date based quality defect detection strategy for spacecraft components},
author = {Taichun Qin and Shouwen Liu and Shouqing Huang and Yuege Zhou},
year = {2020},
doi = {10.1109/DSA51864.2020.00093},
url = {https://doi.org/10.1109/DSA51864.2020.00093},
researchr = {https://researchr.org/publication/QinLHZ20},
cites = {0},
citedby = {0},
pages = {550-554},
booktitle = {7th International Conference on Dependable Systems and Their Applications, DSA 2020, Xi'an, China, November 28-29, 2020},
publisher = {IEEE},
isbn = {978-0-7381-2422-3},
}