Recent Developments in Negative Capacitance Gate-All-Around Field Effect Transistors: A Review - researchr publication authors

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Laixiang Qin, Chunlai Li, Yiqun Wei, Guoqing Hu, Jingbiao Chen, Yi Li, Caixia Du, Zhangwei Xu, Xiumei Wang, Jin He. Recent Developments in Negative Capacitance Gate-All-Around Field Effect Transistors: A Review. IEEE Access, 11:14028-14042, 2023. [doi]

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