Laixiang Qin, Chunlai Li, Yiqun Wei, Guoqing Hu, Jingbiao Chen, Yi Li, Caixia Du, Zhangwei Xu, Xiumei Wang, Jin He. Recent Developments in Negative Capacitance Gate-All-Around Field Effect Transistors: A Review. IEEE Access, 11:14028-14042, 2023. [doi]
@article{QinLWHCLDXWH23,
title = {Recent Developments in Negative Capacitance Gate-All-Around Field Effect Transistors: A Review},
author = {Laixiang Qin and Chunlai Li and Yiqun Wei and Guoqing Hu and Jingbiao Chen and Yi Li and Caixia Du and Zhangwei Xu and Xiumei Wang and Jin He},
year = {2023},
doi = {10.1109/ACCESS.2023.3243697},
url = {https://doi.org/10.1109/ACCESS.2023.3243697},
researchr = {https://researchr.org/publication/QinLWHCLDXWH23},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {11},
pages = {14028-14042},
}