Non-linear CNN-based Read Channel for Hard Disk Drive with 30% Error Rate Reduction and Sequential 200Mbits/second Throughput in 28nm CMOS

Yuwei Qin, Ruben Purdy, Alec Probst, Ching-Yi Lin, Jian-Gang Jimmy Zhu. Non-linear CNN-based Read Channel for Hard Disk Drive with 30% Error Rate Reduction and Sequential 200Mbits/second Throughput in 28nm CMOS. In IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022. pages 206-207, IEEE, 2022. [doi]

@inproceedings{QinPPLZ22,
  title = {Non-linear CNN-based Read Channel for Hard Disk Drive with 30% Error Rate Reduction and Sequential 200Mbits/second Throughput in 28nm CMOS},
  author = {Yuwei Qin and Ruben Purdy and Alec Probst and Ching-Yi Lin and Jian-Gang Jimmy Zhu},
  year = {2022},
  doi = {10.1109/VLSITechnologyandCir46769.2022.9830238},
  url = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830238},
  researchr = {https://researchr.org/publication/QinPPLZ22},
  cites = {0},
  citedby = {0},
  pages = {206-207},
  booktitle = {IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-9772-5},
}