Software Defect Analysis Model Based on Orthogonal Defect Classification

Wang Qin, Pan Tiejun, Xi Lifeng, Yang Xiujin, Zheng Leina. Software Defect Analysis Model Based on Orthogonal Defect Classification. In Sio Iong Ao, Oscar Castillo, Craig Douglas, David Dagan Feng, Jeong-A. Lee, editors, Proceedings of the International MultiConference of Engineers and Computer Scientists 2007, IMECS 2007, March 21-23, 2007, Hong Kong, China. Lecture Notes in Engineering and Computer Science, pages 1082-1086, Newswood Limited, 2007.

Abstract

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