An automatic defect-inspection method for optical isolators using image analysis

Tian Qiu, Zhiquan Lin, Chen-Jung Tsai, Chi-Shing Wong, Xin Zhang, Shuaiqi Liu 0001, Honglong Ning. An automatic defect-inspection method for optical isolators using image analysis. Automatisierungstechnik, 70(7):662-675, 2022. [doi]

Abstract

Abstract is missing.