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JITO: a tool for just-in-time defect identification and localization

Fangcheng Qiu, Meng Yan, Xin Xia 0001, Xinyu Wang, Yuanrui Fan, Ahmed E. Hassan, David Lo 0001. JITO: a tool for just-in-time defect identification and localization. In Prem Devanbu, Myra B. Cohen, Thomas Zimmermann 0001, editors, ESEC/FSE '20: 28th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, Virtual Event, USA, November 8-13, 2020. pages 1586-1590, ACM, 2020. [doi]

Authors

Fangcheng Qiu

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Meng Yan

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Xin Xia 0001

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Xinyu Wang

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Yuanrui Fan

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Ahmed E. Hassan

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David Lo 0001

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