Fangcheng Qiu, Meng Yan, Xin Xia 0001, Xinyu Wang, Yuanrui Fan, Ahmed E. Hassan, David Lo 0001. JITO: a tool for just-in-time defect identification and localization. In Prem Devanbu, Myra B. Cohen, Thomas Zimmermann 0001, editors, ESEC/FSE '20: 28th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, Virtual Event, USA, November 8-13, 2020. pages 1586-1590, ACM, 2020. [doi]
Abstract is missing.