U-SMR: U-SwinT & multi-residual network for fabric defect detection

Hao Qu, Lan Di, Jiuzhen Liang, Hao Liu. U-SMR: U-SwinT & multi-residual network for fabric defect detection. Eng. Appl. of AI, 126(Part D):107094, November 2023. [doi]

Authors

Hao Qu

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Lan Di

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Jiuzhen Liang

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Hao Liu

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