U-SMR: U-SwinT & multi-residual network for fabric defect detection

Hao Qu, Lan Di, Jiuzhen Liang, Hao Liu. U-SMR: U-SwinT & multi-residual network for fabric defect detection. Eng. Appl. of AI, 126(Part D):107094, November 2023. [doi]

Abstract

Abstract is missing.