Investigating Shift Equivalence of Convolutional Neural Networks in Industrial Defect Segmentation

Zhen Qu, Xian Tao, Fei Shen 0002, Zhengtao Zhang, Tao Li. Investigating Shift Equivalence of Convolutional Neural Networks in Industrial Defect Segmentation. IEEE T. Instrumentation and Measurement, 72:1-17, 2023. [doi]

Abstract

Abstract is missing.