Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Gongyuan Qu, Sally L. Wood, Cho Teh. Wafer Defect Detection Using Directional Morphological Gradient Techniques. EURASIP J. Adv. Sig. Proc., 2002(7):686-703, 2002. [doi]
Abstract is missing.