Hot-carrier-reliability design guidelines for CMOS logic circuits

Khandker N. Quader, Eric R. Minami, Wei-Jen Huang, Ping K. Ko, Chenming Hu. Hot-carrier-reliability design guidelines for CMOS logic circuits. J. Solid-State Circuits, 29(3):253-262, March 1994. [doi]

@article{QuaderMHKH94,
  title = {Hot-carrier-reliability design guidelines for CMOS logic circuits},
  author = {Khandker N. Quader and Eric R. Minami and Wei-Jen Huang and Ping K. Ko and Chenming Hu},
  year = {1994},
  month = {March},
  doi = {10.1109/4.278346},
  url = {https://doi.org/10.1109/4.278346},
  researchr = {https://researchr.org/publication/QuaderMHKH94},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {29},
  number = {3},
  pages = {253-262},
}