Yiming Quan, Lawrence Lau, Faming Jing, Qian Nie, Alan Wen, Siu-Yeung Cho. Analysis and machine-learning based detection of outlier measurements of ultra-wideband in an obstructed environment. In 15th IEEE International Conference on Industrial Informatics, INDIN 2017, Emden, Germany, July 24-26, 2017. pages 997-1000, IEEE, 2017. [doi]
Abstract is missing.