Camillo Quattrocchi, Daniele Di Mauro, Antonino Furnari, Giovanni Maria Farinella. Panoptic Segmentation in Industrial Environments Using Synthetic and Real Data. In Stan Sclaroff, Cosimo Distante, Marco Leo, Giovanni Maria Farinella, Federico Tombari, editors, Image Analysis and Processing - ICIAP 2022 - 21st International Conference, Lecce, Italy, May 23-27, 2022, Proceedings, Part II. Volume 13232 of Lecture Notes in Computer Science, pages 275-286, Springer, 2022. [doi]
Abstract is missing.