Anthony Quelen, Gaël Pillonnet, Philippe Flatresse, Edith Beigné. 2 automatic back-biasing compensation unit achieving 50% leakage reduction in FDSOI 28nm over 0.35-to-1V VDD range. In 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018, San Francisco, CA, USA, February 11-15, 2018. pages 304-306, IEEE, 2018. [doi]
@inproceedings{QuelenPFB18,
title = {2 automatic back-biasing compensation unit achieving 50% leakage reduction in FDSOI 28nm over 0.35-to-1V VDD range},
author = {Anthony Quelen and Gaël Pillonnet and Philippe Flatresse and Edith Beigné},
year = {2018},
doi = {10.1109/ISSCC.2018.8310305},
url = {https://doi.org/10.1109/ISSCC.2018.8310305},
researchr = {https://researchr.org/publication/QuelenPFB18},
cites = {0},
citedby = {0},
pages = {304-306},
booktitle = {2018 IEEE International Solid-State Circuits Conference, ISSCC 2018, San Francisco, CA, USA, February 11-15, 2018},
publisher = {IEEE},
isbn = {978-1-5090-4940-0},
}