A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time - researchr publication authors

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Bruce Querbach, Rahul Khanna, David Blankenbeckler, Yulan Zhang, Ronald T. Anderson, David G. Ellis, Zale T. Schoenborn, Sabyasachi Deyati, Patrick Chiang. A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-10, IEEE, 2014. [doi]

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