Bruce Querbach, Rahul Khanna, David Blankenbeckler, Yulan Zhang, Ronald T. Anderson, David G. Ellis, Zale T. Schoenborn, Sabyasachi Deyati, Patrick Chiang. A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-10, IEEE, 2014. [doi]
Abstract is missing.