Using Multisines to Measure State-of-the-Art Analog-to-Digital Converters

Daan Rabijns, Wendy Van Moer, Gerd Vandersteen. Using Multisines to Measure State-of-the-Art Analog-to-Digital Converters. IEEE T. Instrumentation and Measurement, 56(3):1012-1017, 2007. [doi]

Abstract

Abstract is missing.