SCT: An Approach For Testing and Configuring Nanoscale Devices

Reza M. Rad, Mohammad Tehranipoor. SCT: An Approach For Testing and Configuring Nanoscale Devices. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 370-377, IEEE Computer Society, 2006. [doi]

Authors

Reza M. Rad

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Mohammad Tehranipoor

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