Reza M. Rad, Mohammad Tehranipoor. SCT: An Approach For Testing and Configuring Nanoscale Devices. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 370-377, IEEE Computer Society, 2006. [doi]
@inproceedings{RadT06:1,
title = {SCT: An Approach For Testing and Configuring Nanoscale Devices},
author = {Reza M. Rad and Mohammad Tehranipoor},
year = {2006},
doi = {10.1109/VTS.2006.61},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.61},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/RadT06%3A1},
cites = {0},
citedby = {0},
pages = {370-377},
booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2514-8},
}