V. Radhakrishnan, N. Achutan, S. Verghese, R. Santoshkumar. A new approach to the measurement of surface roughness using the pulse-jet capacitance method. In Lakhmi C. Jain, editor, Electronic Technology Directions to the Year 2000, May 23-25, 1995, Adelaide, Australia, Proceedings. pages 294-300, IEEE Computer Society, 1995. [doi]
@inproceedings{RadhakrishnanAVS95,
title = {A new approach to the measurement of surface roughness using the pulse-jet capacitance method},
author = {V. Radhakrishnan and N. Achutan and S. Verghese and R. Santoshkumar},
year = {1995},
doi = {10.1109/ETD.1995.403509},
url = {http://dx.doi.org/10.1109/ETD.1995.403509},
tags = {systematic-approach},
researchr = {https://researchr.org/publication/RadhakrishnanAVS95},
cites = {0},
citedby = {0},
pages = {294-300},
booktitle = {Electronic Technology Directions to the Year 2000, May 23-25, 1995, Adelaide, Australia, Proceedings},
editor = {Lakhmi C. Jain},
publisher = {IEEE Computer Society},
isbn = {0-8186-7085-1},
}