V. Radhakrishnan, N. Achutan, S. Verghese, R. Santoshkumar. A new approach to the measurement of surface roughness using the pulse-jet capacitance method. In Lakhmi C. Jain, editor, Electronic Technology Directions to the Year 2000, May 23-25, 1995, Adelaide, Australia, Proceedings. pages 294-300, IEEE Computer Society, 1995. [doi]
Abstract is missing.