AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment - researchr publication authors

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M. Rafik, A. P. Nguyen, Xavier Garros, M. Arabi, X. Federspiel, C. Diouf. AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 4, IEEE, 2018. [doi]

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