Remaining useful life prediction using prognostic methodology based on logical analysis of data and Kaplan-Meier estimation

Ahmed Ragab, Mohamed-Salah Ouali, Soumaya Yacout, Hany Osman. Remaining useful life prediction using prognostic methodology based on logical analysis of data and Kaplan-Meier estimation. J. Intelligent Manufacturing, 27(5):943-958, 2016. [doi]

Abstract

Abstract is missing.