Performance and reliability trade-offs for high-κ RRAM

Nagarajan Raghavan. Performance and reliability trade-offs for high-κ RRAM. Microelectronics Reliability, 54(9-10):2253-2257, 2014. [doi]

Authors

Nagarajan Raghavan

This author has not been identified. Look up 'Nagarajan Raghavan' in Google