Nagarajan Raghavan. Performance and reliability trade-offs for high-κ RRAM. Microelectronics Reliability, 54(9-10):2253-2257, 2014. [doi]
@article{Raghavan14,
title = {Performance and reliability trade-offs for high-κ RRAM},
author = {Nagarajan Raghavan},
year = {2014},
doi = {10.1016/j.microrel.2014.07.135},
url = {http://dx.doi.org/10.1016/j.microrel.2014.07.135},
researchr = {https://researchr.org/publication/Raghavan14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {9-10},
pages = {2253-2257},
}