Test sequencing problems arising in test planning and design for testability

Vijay Raghavan, M. Shakeri, Krishna R. Pattipati. Test sequencing problems arising in test planning and design for testability. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 29(2):153-163, 1999.

Authors

Vijay Raghavan

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M. Shakeri

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Krishna R. Pattipati

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